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CT.AFD.01.eLM.Certification_Test Version 1.3.pdf
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Title: Certification Test for eLM.AFD.01
Number: CT.AFD.01.eLM
Date: 08/18/2011
Description: Certification Test for DeviceNet for Yaskawa Drives eLearning Module
Rev Number: 1.3
Language: English
Doc Type: Training Documents
Doc SubType: Tests
Related Files: eLearning Module: DeviceNet - Adding and Configuring a Yaskawa Generation 7 Series Drive in a DeviceNet Network

Product Information

Product Group: Inverter Drives
Product Line: E7 Drive, E7B Drive Bypass, E7BR Package, E7C Drive Configured, E7CR Package, E7E Drive Engineered, E7L Drive Bypass, E7N Narrow Bypass Package, E7S Slim Configured Drive, F7 Drive, G5 GPD515 Drive, G7 Drive, Network Comms-DeviceNet, Network Communications Options, P7 Drive, P7B Drive Bypass, P7BR Package, P7C Drive Configured, P7CR Package, P7S Slim Configured Package