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Document information
Title: | Certification Test for eLM.AFD.01 |
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Number: | CT.AFD.01.eLM |
Date: | 08/18/2011 |
Description: | Certification Test for DeviceNet for Yaskawa Drives eLearning Module |
Rev Number: | 1.3 |
Language: | English |
Doc Type: | Training Documents |
Doc SubType: | Tests |
Related Files: | eLearning Module: DeviceNet - Adding and Configuring a Yaskawa Generation 7 Series Drive in a DeviceNet Network |
Product Information
Product Group: | Inverter Drives |
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Product Line: | E7 Drive, E7B Drive Bypass, E7BR Package, E7C Drive Configured, E7CR Package, E7E Drive Engineered, E7L Drive Bypass, E7N Narrow Bypass Package, E7S Slim Configured Drive, F7 Drive, G5 GPD515 Drive, G7 Drive, Network Comms-DeviceNet, Network Communications Options, P7 Drive, P7B Drive Bypass, P7BR Package, P7C Drive Configured, P7CR Package, P7S Slim Configured Package |
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